Minutes, IBIS Quality Committee 02 Sep 2008 11-12 AM EST (8-9 AM PST) ROLL CALL Adam Tambone * Anders Ekholm, Ericsson Barry Katz, SiSoft Benny Lazer Benjamin P Silva Bob Cox, Micron * Bob Ross, Teraspeed Consulting Group Brian Arsenault David Banas, Xilinx Eckhard Lenski, Nokia Siemens Networks Eric Brock * Guan Tao, Huawei Technologies Gregory R Edlund Hazem Hegazy Huang Chunxing, Huawei Technologies John Figueroa John Angulo, Mentor Graphics Katja Koller, Nokia Siemens Networks Kevin Fisher Kim Helliwell, LSI Logic Lance Wang, IOMethodology Lynne Green * Mike LaBonte, Cisco Systems Mike Mayer, SiSoft Moshiul Haque, Micron Technology * Pavani Jella, TI Peter LaFlamme Randy Wolff, Micron Technology Radovan Vuletic, Qimonda Robert Haller, Enterasys Roy Leventhal, Leventhal Design & Communications Sherif Hammad, Mentor Graphics Todd Westerhoff, SiSoft Tom Dagostino, Teraspeed Consulting Group Kazuyoshi Shoji, Hitachi Sadahiro Nonoyama Everyone in attendance marked by * NOTE: "AR" = Action Required. -----------------------MINUTES --------------------------- Mike LaBonte conducted the meeting. Call for patent disclosure: - No one declared a patent. AR Review: - Mike post IQ spec 1.1ag to website - Done, but 1.1ag was already posted so the new version is 1.1ah. - Anders make model to test if IBISCHK detects double-counted Pullup/Pulldown - Done. - Not sure how IBISCHK could detect double counting. - Mike: Might check magnitude of negative V and positive V currents - Anders: Half of clamp current could be in Pulldown - That would be an ugly model - First test model fails IBISCHK (can't drive through Vmeas) - A second model with weakend curves passes IBISCHK - Bob: Might detect knee point in Pullup/Pulldown - Mike: Some problems are caused by the separation of clamp curves: - Would like a new IBIS model with 3 I/V curves: - [High State] - [Low State] - [Disabled State] - Each I/V curve would cover the full range of the state. - Should have 6 V/T curve sets for all 6 transitions. - Bob: Another company proposed this idea: - Raw data requires less processing - Some tools don't split up curve data tha same as others - Clamp currents would not be handled right New items: Continued review of the IBIS Quality Specification: 5.3.13. {LEVEL 2} Clamp I-V behavior not double-counted - Bob: It is common to put current in the wrong table manually. - Anders: Maybe clamp and PullXX curves should be separated by voltage range - There should be no overlap - Mike: Extrapolation causes overlap regardless - Bob: A good practice is to extend all curves full range - Bob: Have seen strange clamp shapes produced by transistor clamps - Sometimes see things that cause suspicion of double counting - Arpad believes this is legal for some - We modified this check to encompass all scenarios. - Bob: Not sure if s2ibis always duplicates ODT currents - We changed the note to say "may not" instead of "does not". 5.3.17. {LEVEL 3} Correlate IV curves to combined curves - This is now handled by the M + S designations, not by separate checks. - Marked for deletion Anders: IBISCHK should warn for large clamp currents - Bob: Might be a CAUTION check - Vendors are trying harder to eliminate WARNINGs - Anders: Many do not care about non-monotonic warnings - Bob: IBISCHK should be 95% right - ODT is becoming common, so the leakage warning appears too often Next meeting: 09 Sep 2008 11-12 AM EST (8-9 AM PST) Meeting ended at 12:08 PM Eastern Time.